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PLATED INSTRUMENTATION PROBES AND SENSORS

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专利名称:PLATED INSTRUMENTATION PROBES AND

SENSORS

发明人:Shari L. Bugaj,Wendell V. Twelves, JR.,Grant

O. Cook, III

申请号:US14331771申请日:20140715

公开号:US20150013480A1公开日:20150115

专利附图:

摘要:A component comprises a non-metallic core having an outer surface, a firstcatalyst deposited onto at least a first portion of the outer surface of the non-metallic

core, a second catalyst deposited onto at least a second portion of the outer surface ofthe non-metallic core, an electrical interface, and a metallic coating. The electricalinterface is plated onto the first catalyst, and includes a first interface layer electrolessplated onto the first catalyst. The metallic coating is plated onto the second catalyst.

申请人:United Technologies Corporation

地址:Hartford CT US

国籍:US

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