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High sensitivity selector of charged particles

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专利名称:High sensitivity selector of charged particles发明人:POURPRIX, MICHEL申请号:EP95401190.4申请日:19950522公开号:EP0685725A1公开日:19951206

专利附图:

摘要:The charged particle selector includes first and second coaxial conducting discs(18, 20), lying spaced apart and parallel. Between the discs there is an electric field. Thefirst disc (18) includes an annular slot (22) communicating with the atmosphere to beanalysed, and the second includes a central extraction orifice. Midway between the two

discs there is a third disc, also having an annular slot (28) at a smaller radius than that ofthe first disc. There is provision to provide a laminar flow of filtered air in a radialdirection (90).

申请人:COMMISSARIAT A L'ENERGIE ATOMIQUE

地址:31-33, rue de la Fédération F-75015 Paris FR

国籍:FR

代理机构:Dubois-Chabert, Guy

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